- -55%
- New
ISO 22278:2020
$162.00
$72.90
Save 55%
ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
standard by International Organization for Standardization, 08/01/2020
Full Description
ISO 22278:2020 specifies the test method for measuring the crystalline quality of single-crystal thin film (wafer) using the XRD method with parallel X-ray beam. This document is applicable to all of the single-crystal thin film (wafer) as bulk or epitaxial layer structure.
M00044362
2021-02-18
New product
ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
standard by International Organization for Standardization, 08/01/2020