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IEC 62525 Ed. 1.0 en:2007
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IEC 62525 Ed. 1.0 en:2007 Standard Test Interface Language (STIL) for Digital Test Vector Data
standard by International Electrotechnical Commission, 11/07/2007
Full Description
Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
M00007950
2021-02-22
New product
IEC 62525 Ed. 1.0 en:2007 Standard Test Interface Language (STIL) for Digital Test Vector Data
standard by International Electrotechnical Commission, 11/07/2007