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IEC 60749-30 Ed. 2.0 b:2020
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IEC 60749-30 Ed. 2.0 b:2020 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
standard by International Electrotechnical Commission, 08/17/2020
Full Description
IEC 60749-30:2020 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation.
M00007210
2021-02-22
New product
IEC 60749-30 Ed. 2.0 b:2020 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
standard by International Electrotechnical Commission, 08/17/2020